%315 @article{HYPeng-JoS-2025, doi = {10.1088/1674-4926/25080028}, url = {https://doi.org/10.1088/1674-4926/25080028}, year = {2025}, publisher = {Chinese Institute of Electronics}, volume = {46}, issue = {11}, pages = {110401}, author = {Peng, Haoyu and Tan, Ping-Heng and Wu, Jiangbin}, title = {Contact planarization and passivation lift tungsten diselenide {PMOS} performance}, journal = {J. Semicond.} }